3M >

3M™ Cleaning Film T-XX, Disc is used in semiconductor manufacturing fab. Probe card is an important part for testing availability of semiconductor chips formed on silicon wafer , and then chips are determined if no problem. High reliablity of probe card is critical for chip production yield, so the probe card must be cleaned by 3M™ Cleaning Film T-XX, laminated on dummy wafer. 3M™ Cleaning Film T-XX, can be easily used with specific size of dummy wafer.